dc.description.abstract | Education is crucial for the growth of a country in terms of economy and social
life since it empowers individuals and enables them to improve their standard in their
daily lives. In Vietnam, there are increased cases of drop out and deteriorating academic
performance among students, which forms research on causes of this phenomenon. Gen
Z, who will soon make up the majority of the workforce, confront particular difficulties
and demands that affect their educational outcomes. Therefore, this research will
examine the relationships to better understand how other factors affect Vietnamese Gen
Z's academic performance. This research employs quantitative methodsto examine data
through convenient sampling and snowball sampling. 253 valid responses were
gathered by the author after conducting an online survey through Google Form and
printed survey. The gathered data was analyzed with the help of both quantitative and
qualitative statistical tools and methods, such as Cronbach’s alpha coefficient and
Exploratory Factor Analysis (EFA) with the help of SPSS software, while testing the
reliability, validity, and forming hypothesis with SMARTPLS. Therefore, regarding
academic engagement, self-efficacy, and peer influence perspectives, it can be
concluded that they have a positive impact on the academic performance of Gen Z
students in Vietnam. This paper also explains the connection between performance and
the influence of peers on performance as well as the impact of peer pressure on
performance all of which are positive. Also, self-efficacy is not correlated to academic
achievement as much as it is involved and as a moderator of the relationship between
peer pressure and academic performance. Lastly, the study provides recommendations
to improve academic success by methods such as promoting healthy relationships with
peers, developing self-confidence, incorporating technology in teaching, and
advocating for changes in the curriculum that focus on teamwork, analytical thinking,
and self-reflection. | en_US |